Download E-books Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) PDF

By Carlos H. Diaz, Sung-Mo (Steve) Kang, Charvaka Duvvury

Electric overstress (EOS) and Electrostatic discharge (ESD) pose essentially the most dominant threats to built-in circuits (ICs). those reliability issues have gotten extra severe with the downward scaling of gadget function sizes. Modeling of electric Overstress in Integrated Circuits provides a entire research of EOS/ESD-related mess ups in I/O safeguard units in built-in circuits.
The layout of I/O safety circuits has been performed in a hit-or-miss means as a result loss of systematic research instruments and urban layout guidance. often, the improvement of on-chip safeguard constructions is a long dear iterative approach that contains tester layout, fabrication, trying out and remodel. while the expertise is modified, an analogous procedure should be repeated virtually solely. This could be attributed to the inability of effective CAD instruments able to simulating the equipment habit as much as the onset of failure that's a 3-D electrothermal challenge. For those purposes, you will need to increase and use an enough degree of the EOS robustness of built-in circuits so one can deal with the on-chip EOS security factor. primary knowing of the actual phenomena resulting in machine mess ups less than ESD/EOS occasions is required for the advance of equipment versions and CAD instruments that could successfully describe the machine habit as much as the onset of thermal failure.
Modeling of electric Overstress in built-in Circuits is for VLSI designers and reliability engineers, really those people who are engaged on the advance of EOS/ESD research instruments. CAD engineers engaged on improvement of circuit point and machine point electrothermal simulators also will enjoy the fabric coated. This ebook can also be of curiosity to researchers and primary and moment yr graduate scholars operating in semiconductor units and IC reliability fields.

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