By Sleiman Bou-Sleiman, Mohammed Ismail
This publication will introduce layout methodologies, often called Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which complement the robustness of radio frequency (RF) and millimeter wave (mmWave) built-in circuits (ICs). those circuits are utilized in present and rising verbal exchange, computing, multimedia and biomedical items and microchips. The layout methodologies awarded will bring about bettering the yield (percentage of operating chips in a excessive quantity run) of RF and mmWave ICs to be able to allow winning production of such microchips in excessive quantity.
Read or Download Built-in-Self-Test and Digital Self-Calibration for RF SoCs (SpringerBriefs in Electrical and Computer Engineering) PDF
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